The invention relates to an apparatus (1) for examining optical properties of surfaces, comprising a first radiation device (2) which is suitable and intended for irradiating radiation in an irradiation direction (R1), characterised by a first irradiation angle (a1), onto the surface to be examined, and comprising a first radiation detection device (12) which is suitable and intended for detecting radiation, and in particular scattered radiation, emitted at a first emission angle (b1) from the surface (10) to be examined in response to the irradiated radiation, and comprising a second radiation detection device (14) which is suitable and intended for detecting radiation emitted at a second emission angle (b2) from the surface (10) to be examined in response to the irradiated radiation, characterised in that the apparatus (1) has a second radiation device (4) which is suitable and intended for irradiating radiation in a second irradiation direction (R2), characterised by a second irradiation angle (a2), onto the surface to be examined, wherein the first irradiation angle (a1) and the second irradiation angle (a2) are substantially mirror-inverted in relation to a direction perpendicular to the surface to be examined.
- 출원번호 : EP2024/065960
- 출원인 : BYK-GARDNER GMBH
- 특허번호 :
- IPC : G01N-021/31(2006.01);G01J-003/50(2006.01);G01N-021/57(2006.01);G01N-021/47(2006.01);G01N-021/84(2006.01);