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  • 506310

    wo


    • 출원번호 : EP2024/066572
    • 출원인 : ASML NETHERLANDS B.V.
    • 특허번호 :
    • IPC : G03F-007/20(2006.01)
  • 506309

    ko

    전자 증기 제공 디바이스(electronic vapour provision device)는, 사용자에 의한 흡입(inhalation)을 위한 증기를 생성하도록 액체를 가열하기 위한 RF(radio frequency) 전자기 방사선(electromagnetic radiation)을 생성하기 위한 적어도 하나의 안테나(315), 적어도 하나의 안테나에 의해 생성되는 RF 전자기 방사선을 제어하기 위한 제어기, 및 RF 전자기 방사선으로부터 사용자를 차폐(shield)시키기 위한 RF 차폐부(RF shield)(311)를 포함하고, RF 차폐부의 하나 이상의 부분들은 모세관 작용에 의해 액체 저장소(326)로부터 액체를 전달하기 위한 하나 이상의 위킹 부재(wicking member)들(312)을 형성한다.
    • 출원번호 : 10-2024-7019754
    • 출원인 : 니코벤처스 트레이딩 리미티드
    • 특허번호 :
    • IPC : A24F-040/46;A24F-040/10;A24F-040/40;A24F-040/42;A24F-040/50;A24F-040/51;A24F-040/53;A24F-040/57;H05B-006/64;
  • 506308

    ko

    시트(sheet) 제조 환경에서 사용되는 센서는 스캐너 헤드들 사이의 갭에 민감할 수 있다.핵 게이지(nuclear gauge)는 스캐너 헤드들 사이의 컬럼 내의 시트 제품 및 가스를 모두 측정한다.갭 거리는 감지 원리에 따라 선형 또는 비선형 방식으로 측정에 영향을 미칠 수 있다.고주파 진동은 핵 게이지의 센서 디바이스들이 이동되게 할 수 있다.측정 작동 중에 듀얼 스캐너 헤드들 상의 작동적 표면들 사이의 센서 갭을 제어하기 위한 기술은 폐쇄루프 제어를 채용하며, 여기서 압전 액츄에이터들이 사용되어 갭 측정 센서 상의 에러 신호를 클로즈(close)함으로써 스캔 전체에 걸쳐 일정한 갭을 유지한다.연속적 시트의 특성을 측정하기 위한 시스템은 복사 에미터들 및 리시버들을 수용하는 듀얼 스캐너 헤드들을 포함한다.갭 측정 신호들은 액츄에이터들에 동력을 공급하며, 이 액츄에이터들은 하나의 센서 디바이스 또는 둘 모두의 센서 디바이스들의 위치를 조절하여 갭을 목표 거리에 유지한다.
    • 출원번호 : 10-2024-0076664
    • 출원인 : 허니웰 인터내셔날 인코포레이티드
    • 특허번호 :
    • IPC : G01N-021/86;G01B-011/14;
  • 506307

    ko

    사용자에 의한 흡입(inhalation)을 위한 증기를 생성하도록 액체를 가열하기 위한 RF(radio frequency) 전자기 방사선(electromagnetic radiation)을 생성하기 위한 안테나 어레인지먼트(antenna arrangement)를 포함하는 전자 증기 제공 디바이스가 개시된다.안테나 어레인지먼트는 제1 섹션(717) 및 제2 섹션(716)을 포함한다.전자 증기 제공 디바이스는 또한, 안테나 어레인지먼트에 의해 생성되는 RF 전자기 방사선을 제어하기 위한 제어기(30), RF 전자기 방사선으로부터 사용자를 차폐(shield)시키기 위한 RF 차폐부(RF shield)(711) ― RF 차폐부는 가열 공동(heating cavity)(720)을 적어도 부분적으로 정의하고, 가열 공동 내에는, 안테나 어레인지먼트에 의해 생성되는 RF 전자기 방사선이 보유(contain)됨 ―, 및 가열 공동 내에 적어도 부분적으로 배열되고 그리고 안테나 어레인지먼트의 제1 섹션과 제2 섹션 사이에 배열되는 내부 지지 구조(internal support structure)(713)를 포함한다.지지 구조(713)는 위킹 부재(712)의 돌출부(protrusion)일 수 있다.
    • 출원번호 : 10-2024-7019751
    • 출원인 : 니코벤처스 트레이딩 리미티드
    • 특허번호 :
    • IPC : A24F-040/46;A24F-040/10;A24F-040/50;A24F-040/51;A24F-040/53;A24F-040/57;A24F-007/00;H05B-006/64;
  • 506306

    ep

    The invention relates to a mirror for focusing electromagnetic radiation. The essence of the invention is that a reflective mirror surface 6 is established on a supporting structure, created by the rotation of elliptical arcs, where the first foci C1 of all elliptical arcs lie on one line and the second foci C2 of all elliptical arcs lie at one fixed point. Each elliptical arc is a part of an ellipse described in a Cartesian coordinate system (x, y, z) by the following equation: y2=b21−x2b2+cz2 where z is independent of x and y, c(z) is the focal distance of the rotated elliptical arcs dependent on z, b is the minor axis of the ellipse, and each ellipse has the same position of the second focus at the point (x = -c, y = 0, z = 0). Each ellipse is rotated around the rotational line 4 (x = -c, y, z = 0), where c is the focal distance corresponding to the distance from the focus to the center of the ellipse placed in the plane {x, y, 0}. Each point in the series C1(z) of the first foci of the rotated elliptical arcs is positioned on the focal line.The invention also relates to a method for focusing electromagnetic radiation and converting it into an electrical signal. The essence of the method is that the above-defined reflective mirror surface focuses radiation from a line source placed parallel to the series of first foci of the rotated elliptical arcs to at least one point on a line parallel to the second focal line. The intensity of the electromagnetic radiation is detected at this point and converted into an electrical signal by changing the electrical characteristic of a photosensitive element in the detector, from which the course of the electromagnetic radiation in time and space is determined.The invention further relates to a device for focusing electromagnetic radiation and converting it into an electrical signal. The essence of the device is that the mirror body 7, on its supporting structure, has the above-defined reflective mirror surface 6. At least one detector 13 of electromagnetic radiation is associated with this mirror body, placed on a line parallel to the second focal line, and connected to a recording device 20.
    • 출원번호 : 24181872.3
    • 출원인 : Západoceskáuniverzita v Plzni;
    • 특허번호 :
    • IPC : G02B-005/10(2006.01);G02B-027/00(2006.01);G02B-027/09(2006.01);
  • 506305

    us

    A method for manufacturing a multispectral filter for electromagnetic radiation including at least two filters, each filter including a first reflective layer, a second reflective layer, a Fabry-Perot cavity dielectric layer, the method including depositing a layer of structuring material onto a carrier substrate including at least two photoelectric transducers; 3D structuring the layer of structuring material to obtain at least two patterns of different heights, one of the patterns having a maximum reference height relative to the carrier substrate; conformally depositing a first reflective layer; depositing a layer of the dielectric material intended to form the dielectric patterns of the Fabry-Perot cavities; planarising the dielectric material by removal with a selective stop at the top of the highest structuring material pattern, depositing a layer made of the same dielectric material so as to complete formation of the Fabry-Perot cavities and a second reflective layer onto the two Fabry-Perot cavities.
    • 출원번호 : 18742381
    • 출원인 : PALANCHOKE, Ujwol
    • 특허번호 :
    • IPC : G03F-007/00(2006.01);G02B-005/28(2006.01);
  • 506304

    wo

    A method for frequency conversion in a single-longitudinal-mode linear resonator (102) includes frequency converting intracavity laser radiation (190) in a nonlinear crystal (120) disposed in a linear resonator (102). The intracavity laser radiation (190) is in a single longitudinal mode of the resonator (102) and forms a standing wave between its end-mirrors (110,112). The method also includes repeatedly sweeping the standing wave back and forth, along an optical axis (106) of the resonator (102), relative to the nonlinear crystal (120). This repeated sweeping may be achieved by dithering the longitudinal position of (a) one or both of the endmirrors (110,112) or (b) the nonlinear crystal (120). Dithering of a single end-mirror (110,112) may be driven by modulating a reference wavelength to which the wavelength of the intracavity laser radiation (190) is locked. Dithering of the longitudinal position of the nonlinear crystal (120) may be achieved with a piezoelectric actuator (500) arranged to adjust angles of a parallelogram-shaped flexure (520) to which the nonlinear crystal (120) is mounted.
    • 출원번호 : EP2024/066475
    • 출원인 : COHERENT LASERSYSTEMS GMBH &CO. KG;
    • 특허번호 :
    • IPC : G02F-001/35(2006.01);H01S-003/109(2006.01);
  • 506303

    wo

    A negative-working lithographic printing plate precursor has a negative-working infrared radiation-sensitive image-recording layer that has a) two or more free radically polymerizable components; b) an initiator composition capable of generating free radicals; and c) one or more infrared radiation absorbing cyanine dyes. The a) two or more free radically polymerizable components comprise a combination of a urethane (meth)acrylate and a polyester (meth)acrylate, which together, comprise 75-100 weight % of all free radically polymerizable components. The weight ratio of the urethane (meth)acrylates to the polyester (meth)acrylates is from 90:10 to and including 35:65. The urethane (meth)acrylates comprise one or more urethane linkages and at least 4 acrylate or methacrylate ester groups. Each of the one or more polyester (meth)acrylates is free of a urethane linkage and is represented following structure (I). These precursors are less sensitive to ambient ozone and can be infrared radiation imaged and developed on-press during lithographic printing.
    • 출원번호 : US2024/033696
    • 출원인 : EASTMAN KODAK COMPANY
    • 특허번호 :
    • IPC : B41C-001/10(2006.01)
  • 506302

    us

    A hollow structure (28) is produced in a workpiece (25) to form a substrate for a mirror through material-removing processing with pulsed laser radiation (35). The pulsed laser radiation is focused into a focal region (39), forming a removal front (46) for the areal removal of material of the workpiece (25) by moving the focal region (39) along a movement pattern (41), and producing the hollow structure (28) by moving the removal front (46) within the workpiece (25). The removal front is not aligned perpendicular to an incoming radiation direction (Z) of the pulsed laser radiation (35) at the radiation entrance side (27) of the workpiece at least intermittently during the production. The hollow structure is produced in the form of a channel through which a fluid is able to flow.
    • 출원번호 : 18741925
    • 출원인 : ULLSPERGER, Tobias
    • 특허번호 :
    • IPC : G02B-005/08(2006.01);B23K-026/55(2006.01);B23K-101/14(2006.01);G03F-007/00(2006.01);
  • 506301

    ep

    The disclosure provides a remote sensing system comprising, a detecting device configured to detect electromagnetic radiation, a first filter disposed at least partially within an optical path of the detecting device, and configured to allow electromagnetic radiation of wavelengths below a first threshold to pass towards the detecting device, and a second filter disposed at least partially within the optical path of the detecting device, and configured to allow electromagnetic radiation of wavelengths above a second threshold to pass towards the detecting device, wherein the first threshold is larger than the second threshold, and wherein at least one of a value of the first threshold or a value of the second threshold is determined based at least in part on a spectrum of interest. The disclosure also provides a method of operating the remote sensing system.
    • 출원번호 : 24382643.5
    • 출원인 : Urugus S.A.
    • 특허번호 :
    • IPC : G01J-003/26(2006.01);G01J-003/28(2006.01);G01J-003/12(2006.01);G01N-021/17(2006.01);