An apparatus for measuring photon density, the apparatus comprising a substrate having a volume for receiving photons from within an optical radiation field, the substrate having an outer periphery, an inner periphery, and an exit aperture, a first reflecting layer coating at least a portion of the outer periphery of the substrate, the first reflective layer configured to integrate the photons within the volume of the substrate, a plurality of entrance openings within the first reflective layer for diffracting the photons entering the volume and a photon detector configured to receive the photons to detect a photon density and to produce an electrical signal representative of the detected photon density, wherein the substrate having the coating is configured such that the photons incident on the exit aperture of the volume of the substrate are at least substantially equally proportional to the photons incident on the plurality of entrance openings.
- 출원번호 : 18654971
- 출원인 : Dunbar, Thomas
- 특허번호 :
- IPC : G01J-001/04(2006.01);G01J-001/44(2006.01);