An inspection system (100) is configured to detect and analyse matter (2), comprising an irradiation arrangement (101) for emitting optical radiation for irradiating said matter (2), a detector system (110) with at least one detector (120) adapted to receive and detect optical radiation, a white reference target element (19), and a switching element (11) comprising at least one inspection zone (12), at least one dark reference zone (13) and at least one white reference zone (14). The switching element (11) is rotatable between at least one inspection position, in which said inspection zone (12) transmits optical radiation originating from said matter (2) towards said detector system (110), at least one dark reference position, in which said switching element (11) blocks at least most of the optical radiation originating from said matter (2) from reaching said detector system (110) and said dark reference zone (13) faces said at least one detector (120), and at least one white reference position, in which said switching element (11) blocks at least most of the optical radiation originating from said matter (2) from reaching said detector system (110) and said white reference zone (14) redirects and transmits optical radiation originating from said white reference target element (19) towards said detector system (110).
- 출원번호 : EP2024/062471
- 출원인 : TOMRA SORTING GMBH
- 특허번호 :
- IPC : G01N-021/27(2006.01);G01N-021/31(2006.01);G01N-021/85(2006.01);G01N-021/88(2006.01);G01N-021/93(2006.01);B07C-005/00(2006.01);G01N-021/33(2006.01);G01N-021/3563(2014.01);G01N-021/359(2014.01);G01N-021/90(2006.01);