• Book : 18()
• Pub. Date : 2025
• Page : pp.38-40
• Keyword :

• Book : 258(2)
• Pub. Date : 2025
• Page : pp.124658
• Keyword :

• Book : 10(1)
• Pub. Date : 2025
• Page : pp.101672
• Keyword :

• Book : 44()
• Pub. Date : 2025
• Page : pp.9
• Keyword :

• Book : 90()
• Pub. Date : 2025
• Page : pp.102281
• Keyword :

• Book : 18(1)
• Pub. Date : 2025
• Page : pp.101204
• Keyword :

• Book : 18(1)
• Pub. Date : 2025
• Page : pp.101200
• Keyword :

How does one’s connectedness in their social relationships affect their health? For a long time, this question has piqued the interest of sociologists. From Durkheim’s theory of suicide to recent empirical studies in medical sociology, the positive association between social integration and well-being has been well established. In this paper, we revisited this topic by focusing on how different sources of social contact is associated with self-rated health in Turkey. To do so, we examined how contact with a close friend, a parent, a sibling, and other family member - outside of one’s nuclear family - compares in terms of their association with self-rated health by using ISSP Social Network Data. We found that frequency of contact with a parent and other family member showed statistically significant and positive associations with self-rated health in some models, which was not the case for a sibling. In the full model accounting for all contact variables, however, only the frequency of contact with a close friend had a statistically significant and positive association with self-rated health. This study aims to start a discussion about the growing importance of non-kin ties in people’s lives in Turkey despite the increasing familialism in Turkish politics and social policymaking. Policymakers and social workers tackling issues such as social isolation, social exclusion, and loneliness in Turkey should consider the prevalence of non-kin networks on individuals’ well-being.

• Book : 42(1)
• Pub. Date : 2025
• Page : pp.227-242
• Keyword :

• Book : 258(1)
• Pub. Date : 2025
• Page : pp.124536
• Keyword :

Abstract

Semiconductor devices contain defects and localized mechanical stress even in their pristine states, persisting after post-fabrication annealing. We hypothesize that these pre-existing conditions, with their lower threshold energy for defect proliferation and/or ionization, may serve as nuclei for radiation damage. To test this hypothesis, we adopted a two-pronged approach: (a) performing electron wind force (EWF) annealing preemptively on pristine Zener diodes to eliminate pre-existing defects before radiation exposure, and (b) applying EWF annealing restoratively on devices already damaged by radiation. The EWF process is non-thermal and can eliminate defects below 30 °C that persist through conventional thermal annealing. Both pristine and EWF-annealed pristine devices were exposed to 15 MeV protons with a fluence of 10¹⁴ cm⁻². Radiation damage increased the ideality factor from 1 to 2.33 in the pristine devices, while the preemptively EWF-annealed devices showed remarkable resilience, with an ideality factor of 1.5. Similar performance improvements were observed with restorative EWF annealing on radiation-damaged devices. This resilience and recovery in performance are further supported by Raman spectroscopy indicating enhanced crystallinity compared to the pristine condition. These findings demonstrate the potential of EWF annealing as both a protective and restorative treatment for semiconductor devices in high-radiation environments.

• Book : 100(1)
• Pub. Date : 2025
• Page : pp.015904
• Keyword :